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Vodafone confirms Ireland, Portugal FTTH expansion

2015-12-02 01:00:00| Total Telecom industry news

U.K.-based telco discussing Italian fibre deployment with electricity firm Enel.

Tags: portugal ireland expansion vodafone

 

Alothon Group Confirms Investment In Brazil's Grupo MPR

2015-11-30 03:48:46| chemicalonline Home Page

Alothon Group LLC, a leading middle market private equity firm dedicated to Brazilian investments, confirmed today that its Alothon Fund III has completed the acquisition of a controlling interest in Grupo MPR

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Coca-Cola Co confirms retirement of science chief as health discussions continue

2015-11-25 16:08:00| Daily beverage news and comment - from just-drinks.com

The Coca-Cola Co's chief science & health officer is to retire. Rhona Applebaum told the company last month of her intention to step down, although Coca-Cola has only confirmed the move this week.

Tags: health science continue chief

 

European Patent Office confirms DSM patent position for Diablo automotive technology

2015-11-23 21:12:35| Canadian Plastics Headlines

Netherlands-based material supplier Royal DSM has won a patent dispute related to its Diablo temperature-resistant technology. In a statement, DSM said the European Patent Office has overturned an attempt to revoke the companys patent for its proprietary Diablo product offering.… The post European Patent Office confirms DSM patent position for Diablo automotive technology appeared first on Canadian Plastics.

Tags: office technology position automotive

 

NIST Confirms Microscope Technique as valid nano-measurement tool.

2015-11-23 14:31:08| Industrial Newsroom - All News for Today

Experiments have confirmed that one technique, developed several years ago at NIST, can enable optical microscopes to measure 3D shape of objects at nanometer-scale resolution. Results could make said technique, Through-focus Scanning Optical Microscopy (TSOM), useful for QC regarding manufacture of such nanoscale devices as next-generation microchips. In 3D shapes, TSOM can detect variations of <1 nm size among objects <50 nm across.

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