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KLA-Tencor Announces New Teron SL650 Reticle Inspection System

2014-06-06 11:06:40| metrologyworld Home Page

Today,KLA-Tencor Corporation(NASDAQ:KLAC) announced the Teron™ SL650, a new reticle quality control solution for IC fabs that supports 20nm design nodes and beyond

Tags: system inspection announces reticle

KLA-Tencor Corporation (KLAC): One Prudent Play on the Chipmaker Market

2013-07-31 10:22:09| Semiconductors - Topix.net

We are living in an era of "hyperinvention." We all want our PCs to operate faster and perform a greater number of tasks simultaneously.

Tags: play market corporation prudent

KLA-Tencor Announces New Additions to Its Defect Inspection and Review Portfolio

2013-07-08 06:00:00| Industrial Newsroom - All News for Today

Coupling electron-beam review with optical inspection facilitates rapid defect discovery, identification and sourcing<br /> <br /> MILPITAS, Calif. -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced the new 2910 Series optical wafer defect inspection platform with NanoPoint™ technology and the new eDR™-7100 electron-beam wafer defect review system. Meeting IC manufacturers' need for accelerated defect sourcing on advanced devices, these two tools combine increased speed with ...This story is related to the following:Optical Inspection Systems | Wafer Inspection Systems

Tags: review portfolio additions inspection

ASML, KLA-Tencor, And Lam Research To Benefit From 450mm Wafer Transition

2013-06-24 13:07:07| Semiconductors - Topix.net

The semiconductor industry is moving to 450mm wafer sizes in the next few years, and semiconductor equipment manufacturers need to position themselves now to reap the benefits.

Tags: research benefit transition lam