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KLA-Tencor Extends Its 5D(TM) Patterning Control Solution with New Metrology Systems

2015-02-26 11:31:44| Industrial Newsroom - All News for Today

Comprehensive Overlay and Films Process Control Solutions Address Advanced IC Process Challenges MILPITAS, Calif. Today, KLA-Tencor Corporation (NASDAQ: KLAC) introduced two advanced metrology systems that support the development and production of 16nm and below IC devices: Archer 500LCM and SpectraFilm LD10...

Tags: control systems solution extends

KLA-Tencor Launches Systems For 5D Patterning Control Solution

2014-09-05 11:21:29| metrologyworld Home Page

Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has introduced the WaferSight PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system, and the K-T Analyzer 9.0 advanced data analysis system

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KLA-Tencor Introduces Key Systems for 5D(TM) Patterning Control Solution

2014-08-26 06:00:00| Industrial Newsroom - All News for Today

Accelerating The Ramp Of Advanced Patterning Techniques For Sub-20nm Design Nodes<br /> <br /> MILPITAS, Calif., -- Today, KLA-Tencor Corporation (NASDAQ: KLAC) introduced the WaferSight(TM) PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system and the K-T Analyzer(®) 9.0 advanced data analysis system. These three new products support KLA-Tencor's unique 5D(TM) patterning control solution, which addresses five elements of patterning ...This story is related to the following:Laboratory and Research Supplies and EquipmentWafer Processing Systems | Data Analysis Software

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KLA-Tencor Introduces Inspection and Review Portfolio for Leading IC Technologies

2014-07-07 06:00:00| Industrial Newsroom - All News for Today

Systems Offer Comprehensive Defect Information for Solving Yield Challenges<br /> <br /> SAN FRANCISCO -- Today at SEMICON West, KLA-Tencor Corporation (NASDAQ: KLAC) announced four new systems--the 2920 Series, Puma(TM) 9850, Surfscan® SP5 and eDR(TM)-7110--that provide advanced defect inspection and review capability for the development and production of 16nm and below IC devices. The 2920 Series broadband plasma patterned wafer, Puma 9850 laser scanning patterned wafer, and Surfscan SP5 ...This story is related to the following:Test and Measuring Instruments Sponsored by: Red Lion Controls - UntitledSearch for suppliers of: Inspection Devices |

Tags: review leading technologies portfolio