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Chemring Technology Solutions Demonstrates World's First Miniaturised GPS Anti-Jamming Technology

2015-03-12 11:31:11| Industrial Newsroom - All News for Today

ROMSEY, England - See GINCAN at the Security Policing Show 10-12 March, Stand D98 At this year's Security and Policing Show, Chemring Technology Solutions will be demonstrating GINCAN - the world's first miniaturised GPS anti-jamming protection and detection product. Illegal GPS jamming equipment is being used...

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Learn about Compendium Solutions - Valtronic's Newest Connectivity Platform - at Wearables TechCon in Santa Clara

2015-03-12 11:31:11| Industrial Newsroom - All News for Today

Solon, Ohio Valtronic, contract manufacturer of miniaturized electronic products for trusted medical device partners, announces that it will highlight the newly launched Compendium Solutions in booth #603 at the upcoming Wearables TechCon, taking place from March 9-11, 2015 at the Hyatt Regency in Santa Clara...

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Digisonics Exhibits Latest Functionality for Cardiovascular Information System Solutions at ACC 2015

2015-03-12 11:31:11| Industrial Newsroom - All News for Today

HOUSTON Digisonics (Booth #2521) will exhibit its newest offerings in Cardiovascular Information System (CVIS) Solutions at this year's American College of Cardiology Annual Scientific Session and Expo in San Diego, Calif.  The Digisonics system is standards-based and vendor-neutral, combining image review...

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Bastian Solutions Welcomes David Strawser as Unified Support Manager

2015-03-12 11:31:08| Industrial Newsroom - All News for Today

Growing Bastian Solutions Welcomes New Hire David Strawser as Unified Support Manager Bastian Solutions, a global material handling systems integrator and expert in e-Commerce fulfillment automation, recently hired David Strawser as Unified Support Manager. As company growth continues across the globe, an ongoing...

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Park Systems Joins Forces With imec To Develop Advancements In Nanoscale AFM Metrology Solutions For Semiconductor Manufacturing

2015-03-12 07:39:15| metrologyworld Home Page

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness

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