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Projects Concern Manufacturing Installs a fourth Mek AOI System

2015-03-10 11:31:14| Industrial Newsroom - All News for Today

Mek (Marantz Business Electronics), has recently announced the installation of a fourth AOI system at Projects Concern Manufacturing.  The Johannesburg based EMS provider recently commissioned an iSpector HDL with Mek statistical control software including CS Center, Repair and Analyser. The system complements their...

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a Recro buys pain medicine, manufacturing plant in a potential $170M deal

2015-03-09 15:38:08| Biotech - Topix.net

Recro Pharma Inc. signed a definitive agreement Monday to acquire the rights to an experimental pain medicine and a contract manufacturing facility from Alkermes in a deal valued at up to $170 million. Under the terms of the agreement, Recro Pharma of Malvern, Pa., will make an upfront payment of $50 million to Alkermes .

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NAM President/CEO calls manufacturing resilient, robust.

2015-03-09 13:31:08| Industrial Newsroom - All News for Today

NAM President and CEO Jay Timmons delivered 2015 State of Manufacturing Address at Purdue University in West Lafayette, IN. "America's success depends on manufacturing’s success," said Timmons, who noted manufacturing to be "as resilient and robust as ever." Timmons cited 4 fundamental values as foundation for U.S. manufacturing success. Also, Timmons spoke on such topics as free and fair trade, corporate tax rates, energy, regulations, health care, labor policy, and infrastructure.

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Wireless Test Set addresses smart device manufacturing needs.

2015-03-09 13:31:06| Industrial Newsroom - All News for Today

Able to perform measurements required to efficiently manufacture Internet-of-Things (IoT) wireless devices, EXM incorporates capabilities that address technology evolutions in wireless communications. Multi-format capabilities, encompassing WLAN and cellular formats, help device manufacturers meet demand for wireless devices focused on smart devices, including Connected Car and IoT. Standard support covers WLAN 802.11p, 802.11ah, 802.11ac Wave 2 Measurements, and Bluetooth® 4.2.

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Park Systems Announces Joint Development Partnership with imec to Develop Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

2015-03-09 11:31:11| Industrial Newsroom - All News for Today

SUWON, Korea  Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness...

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