Home wafer
 

Keywords :   


Tag: wafer

ADEQ fines Pure Wafer $120,000 for not having air quality permit

2013-07-20 16:36:14| Waste Management - Topix.net

The Arizona Department of Environmental Quality reported Friday that Pure Wafer Inc. has agreed to pay $120,000 in civil penalties for not having an air quality permit at its Prescott facility.

Tags: quality air pure permit

 

Swagelok Collaborates with Leading Companies to Guide Next-generation 450mm Wafer Fabs

2013-07-02 06:00:00| Industrial Newsroom - All News for Today

<br /> SOLON, Ohio  &ndash; Swagelok Company is among a group of 10 leading global companies announcing the formation of the Facility 450 Consortium (F450C) to address the complex facility and infrastructure challenges of 450mm semiconductor wafer fabrication.<br /> <br /> Centered at the State University of New York (SUNY) College of Nanoscale Science and Engineering (CNSE) in Albany, N.Y., the F450C is a subgroup of the Global 450 Consortium (G450C), which was formed to ensure a smooth and ...

Tags: guide companies leading wafer

 
 

ASML, KLA-Tencor, And Lam Research To Benefit From 450mm Wafer Transition

2013-06-24 13:07:07| Semiconductors - Topix.net

The semiconductor industry is moving to 450mm wafer sizes in the next few years, and semiconductor equipment manufacturers need to position themselves now to reap the benefits.

Tags: research benefit transition lam

 

Sama Jaya site one of the world's largest solar wafer manufacturing plants

2013-06-21 06:49:40| Semiconductors - Topix.net

KUCHING: One of the world's largest solar wafer manufacturing plants will be built near here at the Sama Jaya Free Industrial Zone.

Tags: site largest manufacturing plants

 

Wafer Analysis System quickly diagnoses root cause of defects.

2013-06-13 14:32:33| Industrial Newsroom - All News for Today

With automated front opening universal pod, Helios NanoLab&trade; 1200AT DualBeam&trade; System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in diameter. By moving 1200AT close to wafer process line, process development and ramp are accelerated. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Wafer Inspection Systems |

Tags: system analysis quickly root

 

Sites : [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] next »