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Debonding Processes promote manufacturing flexibility.

2013-07-09 14:31:03| Industrial Newsroom - All News for Today

LowTemp™ debonding platform features 3 room-temperature wafer debonding processes and extended material supply chain. Two debonding processes have been qualified for EVG high-volume production temporary bonding/debonding (TB/DB) systems – UV laser debonding and multilayer adhesive debonding – in addition to ZoneBOND® technology, which has been implemented into production across compound semiconductor and advanced packaging markets. This story is related to the following:Cyanoacrylate Debonders |

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Manufacturing Software optimizes Pull processes.

2013-06-27 14:28:58| Industrial Newsroom - All News for Today

Leveraging FlexNet's Manufacturing Process Intelligence, Smart-Pull Manufacturing solution adds intelligence to Kanban-driven Pull processes, resulting in smarter pull and optimized operational performance. Solution not only has built-in integration capabilities with sensing devices, but also has capability to store, filter, analyze, and contextualize events in almost real-time – resulting in dynamic triggering and execution of business processes across product supply network and value chain. This story is related to the following:Manufacturing Software | Product Life Cycle Management Software | Process Control Software |

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Continuous Innovation in Packaging and Manufacturing Processes: How to Ensure Best Quality and ...

2013-05-01 06:00:00| Industrial Newsroom - All News for Today

Multitest offers innovative approaches for test strategies of 3D ICs and Sensors &ndash; Meet Multitest at ECTC, May 28-30, Las Vegas<br /> <br /> Rosenheim, Germany &ndash; Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, will exhibit at the upcoming ECTC, scheduled to take place May 28-30, 2013 at The Cosmopolitan in Las Vegas, NV.<br /> <br /> Experts for 3D ...This story is related to the following:Electronic Components and DevicesSensors | Microelectromechanical Systems (MEMS) Test Equipment | Integrated Circuits (IC) |

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