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The ZEISS O-INSPECT Line Is Expanding And Now Offers Multiple System Sizes, Configurations And Options
2015-07-10 05:41:48| metrologyworld Home Page
The ZEISS O-INSPECT multisensor measuring machine is becoming more customizable and now provides even more flexibility for a wide range of applications
Tags: system
line
options
offers
ZEISS and University of California Berkeley Launch Public-Private Partnership to Support Brain Microscopy Innovation Center
2015-06-17 12:31:10| Industrial Newsroom - All News for Today
Microscopy tools optimized for use with emerging neurotechnologies provided for researchers Jena/Germany, Berkeley/USA ZEISS announces that it is participating in a new public-private partnership with UC Berkeley as part of the Brain Microscopy Innovation Center (BrainMIC), a component of the Berkeley BRAIN...
Tags: support
center
university
california
ZEISS Highlights Scanning Electron Microscopes at EIPBN 2015
2015-05-27 12:31:13| Industrial Newsroom - All News for Today
Visit Booth 113 to learn about ZEISS GeminiSEM and ZEISS MultiSEM 505 technology ZEISS announces they will be highlighting a range of scanning electron microscope (SEM) technology at EIPBN, the 59th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication, May 26-29, 2015, at the...
Tags: highlights
electron
scanning
scanning electron
ZEISS Industrial Metrology Surface and Roundness Measurement Systems Offer Additional Analysis for Increased Productivity
2015-05-08 12:31:09| Industrial Newsroom - All News for Today
MAPLE GROVE, Minn. -- The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors. SURFCOM NEX 100 offers a single hybrid detector to measure surface texture and contour at the same time. RONDCOM NEX Rs offers best-in-class spindle accuracy and...
Tags: additional
offer
systems
analysis
ZEISS Industrial Metrology Surface And Roundness Measurement Systems Offer Additional Analysis For Increased Productivity
2015-05-08 07:56:16| metrologyworld Home Page
The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors
Tags: additional
offer
systems
analysis
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