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ZEISS Highlights Scanning Electron Microscopes at EIPBN 2015
2015-05-27 12:31:13| Industrial Newsroom - All News for Today
Visit Booth 113 to learn about ZEISS GeminiSEM and ZEISS MultiSEM 505 technology ZEISS announces they will be highlighting a range of scanning electron microscope (SEM) technology at EIPBN, the 59th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication, May 26-29, 2015, at the...
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scanning electron
Scanning Electron Microscope delivers 3D volume imaging.
2014-09-09 14:30:51| Industrial Newsroom - All News for Today
Integrating SEM with VolumeScope™ in-chamber microtome and analytical software, Teneo VS™ provides fully automated, large-volume reconstructions with optimized Z-axis resolution. VolumeScope uses serial block face imaging to acquire 3D volume from block of tissue or cells. ThruSight multi-energy deconvolution resolves features at different depths within each slice, while MAPS software uses tiling and stitching to acquire high-resolution composite images that are larger than single field of view. This story is related to the following:Materials and Material ProcessingElectron Microscopes | Microtomes | Research Microscopes
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electron
Scanning Electron Microscope delivers high definition imaging.
2013-12-24 14:29:06| Industrial Newsroom - All News for Today
Intended for material and life sciences applications, EVO Series delivers workflow automation, reducing typical workflow from over 400 steps to just 15. Workflow productivity is also improved by automated image settings such as beam alignment, magnification, and focus. Mid-column click-stop aperture changer ensures reproducible results, while beam deceleration technology and high definition BSE detector provide images rich in topographical information.<br /> This story is related to the following:Electron Microscopes
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definition
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imaging
Power Supply supports scanning electron microscopes.
2013-01-17 14:30:07| Industrial Newsroom - All News for Today
Housed in 25 x 12 x 20 cm enclosure, Model 3603 comprises 3 power supplies used by SEMs and inspection systems: -30 kV at 330 µA accelerator, -1 kV at 25 µA Wehnelt, and 5 Vdc at 3 A floating filament. Filament and Wehnelt voltages are floating on accelerator voltage. All 3 are remotely programmable via RS-232 or USB data port and connected to SEM through 3-pin Federal connector. Plug-in terminal block connects 24 Vdc input power, external safety interlock, and HV On status bit. This story is related to the following:High Voltage Power Supplies |
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