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Tag: diagnoses
Dallas hospital diagnoses first patient with Ebola
2014-10-01 03:40:14| Biotech - Topix.net
The Centers for Disease Control and Prevention has confirmed the first case of Ebola in a patient diagnosed in a U.S. hospital, officials announced Tuesday. The patient is an unnamed man at Texas Health Dallas hospital diagnoses first patient with Ebola The Centers for Disease Control and Prevention has confirmed the first case of Ebola in a patient diagnosed in a U.S. hospital, officials announced Tuesday.
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Louisiana Ranked 4th Nationally In Rate Of Diabetes Diagnoses
2014-07-15 12:23:56| Biotech - Topix.net
Louisiana ranks 4th in the nation in the rate of diabetes diagnoses, according to the U.S. Centers for Disease Control and Prevention, with 10% of adults living with the disease.
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louisiana
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Portable Hand-held Meter diagnoses hydraulics and pneumatics.
2013-12-12 14:31:31| Industrial Newsroom - All News for Today
With scan rate of 1 ms and ability to measure pressure, flow, temperature, and rpm, SensoControl® Diagnostic Serviceman Plus™ provides maintenance and diagnostic data for hydraulics and pneumatics. Plug and Play automatic sensor recognition immediately scales measurement range, eliminating confusing setup routines. All measurements can be stored on nano USB drive or transferred to PC for analysis and documentation. Measuring 4 x 7 x 2 in., meter operates on rechargeable 3.7 V Li-Ion battery. This story is related to the following:Sensors, Monitors and TransducersPneumatic Testers | Temperature Meters | Pressure Meters |
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Intelligent 'iKnife' diagnoses cancer midsurgery
2013-07-18 22:43:56| CNET News.com
Instead of sending tissue to a lab and waiting 30 minutes before resuming surgery, surgeons hope the iKnife will let them know instantly whether something is malignant. [Read more]
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intelligent
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Wafer Analysis System quickly diagnoses root cause of defects.
2013-06-13 14:32:33| Industrial Newsroom - All News for Today
With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in diameter. By moving 1200AT close to wafer process line, process development and ramp are accelerated. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Wafer Inspection Systems |
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