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New APM650 Optical Profiler from Zygo

2015-08-25 19:01:54| Semiconductors - Topix.net

MIDDLEFIELD, CT Zygo Corporation, a unit of AMETEK Ultra Precision Technologies, has introduced the APM650 large platform profiler for production metrology of advanced printed circuit board packaging applications. The new APM650 system employs ZYGO's industry-leading Coherence Scanning Interferometry measurement technology that enables manufacturers to quantify critical feature parameters on PCB panels up to 650 x 650mm.

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Optical Profiler

2015-08-04 22:22:55| Semiconductors - Topix.net

Zygo Corporation introduced the ZeGage Plus optical profiler, a full-featured instrument for the 3D measurement of surface topography and roughness. The system provides the same ease of use, vibration robustness and small footprint as the ZeGage profiler but with a higher level of precision, faster measurement speed, and an increased range of measurable surfaces and features.

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Optical Profiler combines precision and versatile applicability.

2015-05-15 14:31:09| Industrial Newsroom - All News for Today

Used for 3D measurement of surface topography and roughness, ZeGage™ Plus can measure and analyze any surface – rough or specular, transparent or opaque, high or low reflectivity – and supports objectives for selecting desired magnification and field of view. SureScan™ technology eliminates need for vibration isolation system, while Mx™ software allows data visualization and quantification of step heights, texture, and volumetric applications. Automated XY sample stages are optional.

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