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Atomic Force Microscope supports multiple imaging modes.

2013-12-11 14:29:46| Industrial Newsroom - All News for Today

Used for nanoscale measurement, characterization, and manipulation, 7500 AFM achieves atomic resolution imaging with its 90 µm AFM closed-loop scanner. Integrated environmental chamber provides accessible, sealed sample compartment completely isolated from rest of system. Humidity and temperature sensors track conditions in situ, and oxygen and reactive gases can be introduced into and purged from sample chamber. Optional sample temperature controller allows control from -30 to +250°C. This story is related to the following:Atomic Force Microscopes

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