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Jordan Valley Semiconductors Wins More Market Share in Advanced Wafer Level Packaging

2014-07-03 06:00:00| Industrial Newsroom - All News for Today

MIGDAL HAEMEK, Israel – Jordan Valley Semiconductors Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that its micro-spot X-ray Fluorescence (microXRF) metrology tool has been qualified for production monitoring of advanced Wafer Level Packaging (WLP) processes, by another leading memory player. The tool provides fully automated metrology solutions for several key applications, including single micro-bump chemical ...This story is related to the following:Laboratory and Research Supplies and EquipmentWafer Inspection Systems | X-Ray Inspection Systems

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