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Rudolph Technologies to Participate in the 3rd Annual Midtown CAP Summit 2014
2014-12-10 01:05:51| Electronics - Topix.net
Rudolph Technologies, Inc. , a leading provider of process characterization equipment, lithography equipment and software for wafer fabs and advanced packaging facilities, announced that the Company's management will participate in the 3rd Annual Midtown CAP Summit 2014, Wednesday December 10, 2014 in New York, NY. About The 3rd Annual Midtown CAP Summit 2014 Investor Conference Rudolph is scheduled to participate in the 3rd Annual Midtown CAP Summit 2014 Investor Conference, being held December 10, 2014 at the Marriott Marquis, New York, NY.
Tags: annual
technologies
cap
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Rudolph Technologies to Participate in the 3rd Annual Midtown CAP Summit 2014
2014-12-10 00:50:30| Semiconductors - Topix.net
Rudolph Technologies, Inc. , a leading provider of process characterization equipment, lithography equipment and software for wafer fabs and advanced packaging facilities, announced that the Company's management will participate in the 3rd Annual Midtown CAP Summit 2014, Wednesday December 10, 2014 in New York, NY. About The 3rd Annual Midtown CAP Summit 2014 Investor Conference Rudolph is scheduled to participate in the 3rd Annual Midtown CAP Summit 2014 Investor Conference, being held December 10, 2014 at the Marriott Marquis, New York, NY.
Tags: annual
technologies
cap
participate
Rudolph Gains Traction in Mobile Device Market with Multi-System...
2014-11-17 14:47:59| Semiconductors - Topix.net
Rudolph Technologies, Inc. announced today that it has received multi-system orders from several customers for its latest MetaPULSEA G metal metrology system in support of their mobile device components ramp. The MetaPULSE systems will provide critical process control metrology enabling the manufacture of advanced multi-band and multi-mode frequency components used in the latest generation of smartphones and mobile devices.
Tags: market
mobile
device
gains
Rudolph Wins Yield Management Software Sale from the College of Nanoscale Science and Engineering
2014-09-02 06:00:00| Industrial Newsroom - All News for Today
Leading research enterprise recognizes the value of the analytics that Rudolph’s Yield Management Software will bring to its Global 450 Consortium program<br /> <br /> Flanders, New Jersey – Rudolph Technologies, Inc. (NYSE: RTEC) announced today that the SUNY College of Nanoscale Science and Engineering (CNSE), Albany, NY, has selected its Discover Enterprise™ Yield Management Software (YMS) to provide an integrated data warehouse and analytics system for the Global 450 ...This story is related to the following:Defect Tracking Software | Process Control Software
Tags: software
management
sale
science
Rudolph Receives Volume Purchase Order from Major Taiwan OSAT for 2D/3D Inspection Systems
2014-08-11 06:00:00| Industrial Newsroom - All News for Today
Large order for multiple NSX inspection tools includes Wafer Scanner system and Discover yield management software to provide a comprehensive 2D/3D solution for advanced packaging processes<br /> <br /> Flanders, New Jersey – Rudolph Technologies, Inc. (NYSE: RTEC) announced today that it has received a large order from one of Taiwan’s providers of independent semiconductor manufacturing services in assembly and test (OSAT). The order includes: multiple NSX® systems for ...This story is related to the following:SoftwareSearch for suppliers of: Metrology Software | Wafer Inspection Systems
Tags: order
systems
major
purchase
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