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Rudolph Wins Multiple Orders for AWX Unpatterned Wafer Inspection Tools in Back-End and ...
2013-11-21 06:00:00| Industrial Newsroom - All News for Today
AWX system combines the sensitivity, speed and data analysis needed to optimize back-end processes and minimize cost<br /> <br /> Flanders, New Jersey — Rudolph Technologies, Inc. (NASDAQ: RTEC) announced today that it has won orders for its AWX™ FSI unpatterned wafer inspection system at both a major Southeast Asia-based outsourced assembly and test (OSAT) facility and a key Korean memory manufacturer. In both cases, the systems were selected after direct comparison with ...This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Wafer Inspection Systems
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multiple
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inspection
Rudolph Technologies' Management System Earns ISO 9001:2008 Certification
2013-11-19 06:00:00| Industrial Newsroom - All News for Today
Registration reflects commitment to continuous process improvement and pursuit of customer satisfaction<br /> <br /> Flanders, New Jersey — Rudolph Technologies, Inc. (NASDAQ: RTEC) announced today that it has earned certification to ISO 9001:2008 for its quality management system and shared services corporate departments at three of its major business unit locations. The rigorous certification process reinforces the Company's commitment to providing the best quality products and ...This story is related to the following:Quality Management Software
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management system
Rudolph Technologies Reports 2013 Third Quarter Results
2013-11-05 07:48:25| Semiconductors - Topix.net
Rudolph Technologies, Inc. , a leading provider of process characterization equipment, lithography equipment and software for wafer fabs and advanced packaging facilities, today announced financial results for the third quarter of 2013.
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reports
technologies
quarter
Rudolph Adds NSX 220 System To Macro Defect Inspection Family
2013-09-05 06:33:26| metrologyworld Home Page
Rudolph Technologies, Inc. recently announced the availability of its new NSX 220 Automated Macro Defect Inspection System
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family
inspection
adds
Rudolph Adds NSX 220 System to Macro Defect Inspection Family
2013-09-04 02:36:07| Semiconductors - Topix.net
The new NSX tool is designed for semiconductor, MEMS and LED packaging and test facilities to achieve productivity at a low price point )--Rudolph Technologies, Inc. today announced the availability of its new NSXA 220 Automated Macro Defect Inspection System .
Tags: system
family
inspection
adds
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